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GRADE	PART NO.	DESCRIPTION	QUANTITY (EA)	PRICE
300mm TEST 45nm≤50EA, DSP	12SW22001	◈ Dophant : Boron ◈ RES.(Min~Max) : 1 ~ 50 Ω㎝ ◈ THK.(Min~Max) : 745.0~805.0 ㎛	3,000	USD 65.5
300mm TEST 50nm ≤ 50EA, DSP	12PS0B007	◈ Dophant : Boron ◈ RES.(Min~Max) : 1 ~ 35 Ω㎝ ◈ THK.(Min~Max) : 755.0~795.0 ㎛	175	USD 73.2
150mm(6") Si Wafer 0.3㎛≤10EA, SSP	06SW19002	◈ Dophant : Boron ◈ THK.(Min~Max) : 655.0~695.0㎛ ◈ Surface Finish : Single Side Polished	9999	USD 19.2 / pcs
100mm(4") Si Wafer 0.3um ≤10EA, SSP	04SW19001	◈ Dophant : Boron ◈ THK.(Min~Max) : 500.0~540.0㎛ ◈ Surface Finish : Single Side Polished	9999	USD 8.5 / pcs
300mm TEST 200nm≤50EA, DSP	12PS0B003	◈ Dophant : BORON ◈ RES.(Min~Max) : 8 ~ 12 Ω㎝ ◈ THK.(Min~Max) : 755.0~795.0 ㎛	125	USD 37.7
300mm TEST 200nm≤30EA, DSP	12PS0B006	◈ Dophant : BORON ◈ RES.(Min~Max) : 0.5 ~ 100 Ω㎝ ◈ THK.(Min~Max) : 750.0~800.0 ㎛	25	USD 37.7
300mm TEST 120nm≤80EA, N TYPE	12NS0B001	◈ Dophant : PHOS ◈ RES.(Min~Max) : 5 ~ 20 Ω㎝ ◈ THK.(Min~Max) : 755.0~795.0 ㎛	200	USD 53.0
300mm TEST 120nm≤80EA, N TYPE	12NS0B002	◈ Dophant : PHOS ◈ RES.(Min~Max) : 5 ~ 20 Ω㎝ ◈ THK.(Min~Max) : 755.0~795.0 ㎛	25	USD 53.0

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